Radiation Characterization and Performance Evaluation of the LX2160 Space Processor
As space missions increasingly rely on high-performance onboard computing, processors must deliver advanced processing capability while maintaining predictable behavior in harsh radiation environments. This white paper presents a comprehensive radiation characterization of the LX2160-Space processor, a multicore System-on-Chip based on NXP’s QorIQ® Layerscape architecture and enhanced through Teledyne e2v’s space-grade manufacturing and qualification flow.
The study consolidates results from an extensive radiation test campaign, including Total Ionizing Dose (TID) exposure up to 100 krad(Si), Single Event Latch-up (SEL) testing under worst-case heavy-ion conditions, and detailed Single Event Effects (SEE) evaluations across processor cores, memory subsystems, and high-speed interfaces. The results demonstrate stable functional operation under cumulative radiation exposure, complete immunity to destructive latch-up, and predictable, non-destructive SEE behavior with effective recovery using standard mitigation techniques.
By combining architectural protection mechanisms such as ECC, multiple power and clock domains, and software-driven recovery strategies, the LX2160-Space processor enables system-level resilience without relying exclusively on fully radiation-hardened design approaches. This paper provides system designers with valuable data and analysis to support the integration of high-performance processing solutions into next-generation space platforms, from LEO to GEO and beyond.
If you wish to read more, click here to dowload the complete white paper.
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